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Non-destructive test method to qualify linear grating of optical encoder by using Talbot effect.
 
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技術名稱
Technology
Non-destructive test method to qualify linear grating of optical encoder by using Talbot effect.
發明人
Inventor
鄭正元, 林孟駿, Hossein,
所有權人
Asignee
國立臺灣科技大學

專利國家
Country
申請號
Application No.
專利號
Patent No.
中心案號
Serial No.
中華民國 104122477 申請中 1030104TW0
美國 14/755,743 US9581434B2 1030104US0
 
點閱數:296
技術摘要:
Theoretically, when a plane light or collimated light is radiated to a fine grating part, the reflected light make an images of diffraction grating is repeated at regular distance. This image is called self-image or Talbot image. This apparatus used this phenomenon to measure the quality of linear scale. The Talbot image of linear scale is observed by a CMOS camera and a 10X objective lens. When the scale was moving by a motorized stage under OM, the effect of Talbot image will moved also. The changes of pixel’s intensity will be sinusoidal. The quality of linear scale will be verified by uniformity and matching of these two curves.


 
   




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