國立台灣科技大學-專利商品網-研發人才-施劭儒

材料科學與工程系(所)

學經歷：

學歷:
英國牛津大學材料系,博士,2009
國立台灣大學,材料科學與工程系,碩士,2000

經歷:
國立臺灣科技大學,材料科學與工程學系,助理教授
美國,凱斯西儲大學,材料科學與工程系,博士後研究員
英國,牛津大學,材料系,博士後研究員
台灣工業技術研究院,材料工程研究所,副研究員

專業技術

1.固態氧化物燃料電池
2.穿透式電子顯微鏡
3.電子陶瓷
4.奈米顆粒分析與鑑定

專利介紹

一種製備銀顆粒的方法及核殼結構銀顆粒

	中文摘要: 近年來核殼及中空結構銀粉逐漸被重視主要是其優異的性質被廣泛用於導體、構裝及敷材。......

研究成果與計畫

教授課程

X-ray繞射與結晶學
材料分析
陶瓷燒結與晶界工程

榮譽獎項

Research Student Bursary of Interfacial Materials Computational and Experimental Multi-Scale Studies: INCEMS (Funded by European Commission) (2006-2008)
Taiwan Ministry of Education Scholarship for Study Overseas (2006-2008)
Quality Award, ITRI, 2003 – an Annual Award for Projects with Highest Management Quality Control

期刊論文

1. S. J. Shih, P. R. Herrero, G. Q. Li, C. Y. Chen, and S. Sergio Lozano-Perez, “Characterization of mesoporosity in ceria particles using electron microscopy,” Microscopy and Microanalysis (accepted) (2010) (SCI subject: Microscopy, N/M=1/9=11.1%; SCI, IF2009:3.035)

2. G. Q. Li, S. C. Mu, and S. J. Shih, “Achieving atomically flat surfaces for LiGaO2 substrates for epitaxial growth of GaN films,” Materials Science and Engineering: B, 170, 9-14. (2010) (SCI subject: Materials Science, Multidisciplinary, N/M=62/212=29.2%; SCI, IF2009:1.756)

3. S. von Alfthan, N. A. Benedek, L. Chen, A. Chua, D. J. H. Cockayne, K. J. Dudeck, C. Elsasser, M. W. Finnis, C. T. Koch, B. Rahmati, M. Rühle, S. J. Shih and A. P. Sutton, “The structure of grain boundaries in strontium titanate: theory, simulation, and electron microscopy,” Annual Review of Materials Research (accepted) (SCI subject: Materials Science, Multidisciplinary, N/M=9/212=4.2%; SCI, IF2009:7.911)

4. S. J. Shih, K. B. Borisenko, L. J. Liu and C. Y. Chen, “Multiporous ceria nanoparticles prepared by spray pyrolysis,” Journal of Nanoparticle Research 12, 1553-1559 (2010) (SCI subject: Materials Science, Multidisciplinary, N/M=39/212=18.4%;SCI, IF2009: 2.478)

5. G. Li, S. J. Shih and Z. Fu, “A new system for synthesis of high quality nonpolar GaN thin films” Chemical Communications 46, 1206-1208 (2010) (SCI subject: Chemistry, Multidisciplinary, N/M=15/138=10.9%; SCI, IF2009: 5.504)

6. G. Li, S. J. Shih, S. Mu, T. Wang and W. Jie, “Study of Te nano-precipitates in CdZnTe crystals,” Journal of Materials Research 25, 1298-1303 (2010) (SCI subject: Materials Science, Multidisciplinary, N/M=72/212=34.0%; SCI, IF2009: 1.667)

7. S. J. Shih, S. Lozano-Perez and D. J. H. Cockayne, “Investigation of grain boundaries for abnormal grain growth in polycrystalline SrTiO3,” Journal of Materials Research 25, 260-265 (2010) (SCI subject: Materials Science, {施劭儒博士簡歷} Page 2

Multidisciplinary, N/M=72/212=34.0%; SCI, IF2009: 1.667)

8. M. Bäurer, S. J. Shih, C. Bishop, M. P. Harmer, D. Cockayne and M.J. Hoffmann, “Abnormal grain growth in undoped strontium titanate,” Acta Materialia 58, 290-300 (2010) (SCI subject: Metallurgy & Metallurgical Engineering=1/70=1.4%; SCI, IF2009: 3.760)

9. S. J. Shih, L.Y. Chang, C.Y. Chen, K. B. Borisenko and D. J. H. Cockayne, “Nanoscale yttrium distribution in

yttrium-doped ceria powder,” Journal of Nanoparticle Research 11, 2145-2152 (2009) ((SCI subject: Materials Science, Multidisciplinary, N/M=39/212=18.4%;SCI, IF2009: 2.478)

10. A. Al-Saadi, C. H. Yu, V. Khutoryanskiy, S. J. Shih, A. Crossley and S. C. E. Tsang,, “Layer-by-layer electrostatic entrapment of protein molecules on superparamagnetic nanoparticle: new strategy to enhance adsorption capacity and maintain biological activity,” Journal of Physical Chemistry C 113, 15260-15265 (2009) (SCI subject: Materials Science, Multidisciplinary, N/M=22/212=10.4%; SCI, IF2009: 4.224)

11. S. J. Shih, G. Li, D. J. H. Cockayne and K. B. Borisenko, “Mechanism of dopant distribution: an example of nickel-doped ceria nanoparticles,” Scripta Materialia 61, 832-835 (2009) (SCI subject: Metallurgy &Metallurgical Engineering=2/70=2.9%; SCI, IF2009: 2.949)

12. S. J. Shih, C. Bishop and D. J. H. Cockayne, “Distribution of Σ3 misorientations in polycrystalline strontium titanate,” Journal of the European Ceramic Society 29, 3023-3029 (2009) (SCI Subject: Materials Science, Ceramics, N/M=1/25=4.0%; SCI, IF2009:2.090)

13. L. F. Zagonel, M. Bäurer, A. Bailly, O. Renault, M. Hoffmann, S. J. Shih, D. Cockayne , N. Barrett, “Orientation dependent work function of in situ annealed strontium titanate,” Journal of Physics: Condensed Matter 21, 314013-1-5 (2009) (SCI subject: Physics, Condensed Matter, N/M=17/66=25.8%; SCI, IF2009:1.964)

14. S. J. Shih, Y. Huang, Y. R. Lyu and C. Y. Chen, “Cross-sectional observation of yttrium and nickel oxide doped ceria powder” Journal of Nanoscience and Nanotechnology 9, 3898-3903 (2009) (SCI subject: Materials Science, Multidisciplinary, N/M=86/212=40.6%; SCI, IF2009:1.435)

15. Y. Zhang, Y. Huang, Y. Wang, X. Ji, S. J. Shih, and B. Jia, “Study of nano-Ag particles doped TiO2 prepared by photocatalysis,” Journal of Nanoscience and Nanotechnology 9, 3904-3908 (2009) (SCI subject: Materials Science, Multidisciplinary, N/M=86/212=40.6%; SCI, IF2009:1.435)

16. C. H. Yu, A. Al-Saadi, S. J. Shih, L. Qiu, K. Y. Tam, and S. C. Tsang, “Immobilization of BSA on silica-coated magnetic iron oxide nanoparticle,” Journal of Physical Chemistry C, 113 537-543 (2009) (SCI subject: Materials Science, Multidisciplinary, N/M=22/212=10.4%; SCI, IF2009: 4.224)

17. G. Li, S. J. Shih, Y. Huang, T.Wang and W. Jie, “Nanostructures of defects in CdZnTe single crystals,” Journal of Crystal Growth, 311 85-89 (2008) (SCI subject: Crystallography, N/M=12/25=48.0%; SCI, IF2009:1.534)

18. L. F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Bäurer, M. Hoffmann, S. J. Shih and D. J. H. Cockayne, “Orientation dependent surface composition of in situ annealed strontium titanate”, Surface and Interface Analysis 40, 1709-1712 (2008) (SCI subject: Chemistry, Physical, N/M=90/121=74.4%; SCI, IF2009:0.998)

19. S. J. Shih, M. B. Park and D. J. H. Cockayne, “The interpretation of indexing of high Σ CSL grain boundaries from ceramics”, Journal of Microscopy, 227 309-314 (2007) (SCI subject: Microscopy, N/M=6/9=66.7%; SCI, IF2009:1.612)

20. M. B. Park, S. J. Shih and D. J. H. Cockayne, “The preferred CSL misorientation distribution in polycrystalline SrTiO3”, Journal of Microscopy, 227 292-297 (2007) (SCI subject: Microscopy, N/M=6/9=66.7%; SCI, IF2009:1.612)

21. S. J. Shih and W. H. Tuan, “Solubility of Ag and Pd in BaTiO3”, Journal of the American Ceramic Society 87, 401-407 (2004) (SCI subject: Materials Science, Ceramics, N/M=2/25=8%; SCI, IF2009:1.944)

22. C. J. Shih, S. J. Shih, H. C. Lin, H. H. Yeh, and Y. C. Hung, “Thermal-decomposition and crystallization behaviour of coupling agents for silver paste application”, Nanotechnology 14, 1014-1018 (2003) (SCI subject: Engineering, Multidisciplinary, N/M=2/79=2.5%; SCI, IF2009:3.137)

專利

1. H. C. Lin, C. J. Shih, H. H. Yeh, H. N. Lin, and S. J. Shih, “Discrete component and structure of fabrication Thereof”, ROC Patent 544694, 08/01/2003-08/01/2023
2. Y. C. Hung, H. C. Lin, C. J. Shih, and S. J. Shih, “Conductive layers and fabrication methods thereof”, US Patent 7135394, 2006

會議論文

1. S. J. Shih, K. J. Dudeck, and D. J. H. Cockayne, “Crystallographic and structural characterization of planar grain boundaries in polycrystalline SrTiO3,” Electron Microscopy and Analysis Group Conference, Sheffield, UK (2009)
2. S. J. Shih, N. P. Young, and K. J. Dudeck, S. Y. Choi, M. Baeurer, M. J. Hoffmann and D. J. H. Cockayne, “Structural and orientation investigations of planar grain boundaries in polycrystalline,” Electroceramics XI, Manchester, UK (2008)
3. L. F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Bauer, S. J. Shih, D. J. H. Cocknayne and M. Hoffmann, “Orientation dependent surface terminations of in situ annealed polycrystalline SrTiO3 determined by energy filtered XPEEM with NanoESCA”, 12th European Conference on Applications of Surface and Interface Analysis, Brussels, Flagey (2007)
{施劭儒博士簡歷} Page 3
4. S. J. Shih, N. A. Benedek, M.W. Finnis, A. P. Sutton, M. Baeurer, M. Hoffmann and D. J. H. Cockayne, “Measurement of grain boundary orientations in polycrystalline materials”, Electron Microscopy and Analysis Group Conference, Glasgow, UK (2007)
5. K. J. Dudeck, S. J. Shih, C.T. Koch, D. J. H. Cockayne, “High resolution TEM studies of grain boundaries in Si3N4 and SrTiO3”, Electron Microscopy and Analysis Group Conference, Glasgow, UK (2007)
6. S. J. Shih, K. J. Dudeck, S. Y. Choi, M. Baeurer, M. Hoffmann and D. J. H. Cockayne, “High resolution EM studies of grain boundaries in polycrystalline SrTiO3”, European Materials Research Society Spring Meeting, Strasbourg, France (2007).
7. M. B. Park, S. J. Shih, N. H. Cho and D. J. H. Cockayne, “EBSD studies of the grain size and grain orientation distribution of the SrTiO3”, Conference of the Korean Institute of Electrical and Electronic Materials Engineers, Mu-Ju Resort, Korea (2006).
8. S. J. Shih, M. B. Park and D. J.H. Cockayne, “The interpretation of electron back scatter diffraction patterns from ceramics”, 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)
9. M. B. Park, S. J. Shih and D. J. H. Cockayne, “Analysis of the grain boundary properties of the SrTiO3 and BaTiO3 using EBSD”, 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)

Contributed Talk

1. “Observation of T-junction Grain Boundaries in SrTiO3”, M18 Meeting of Interfacial Materials- Computational and Experimental Multi-Scale Studies, Karlsruhe, Germany, January 11-13, 2007
2. “Orientation Studies of Grain Boundaries in Strontium Titanate”, M12 Meeting of Interfacial Materials- Computational and Experimental Multi-Scale Studies, London, UK, August 3-5, 2006

Skills

Electron Microscopy
Electron Backscatter Diffraction (EBSD), High Resolution Transmission Electron Microscopy (HRTEM), Double Corrected Transmission Electron Microscopy, Energy-Dispersive X-Ray (EDX), Focus-Ion Beam (FIB), Electron Energy Loss Spectroscopy (EELS) and Scanning Transmission Electron Microscopy - High Angle Annular Dark Field Image (STEM-HAADF)

Other Material Analysis

Rheometer, Differential Scanning Calorimetry (DSC), Thermogravimetry Analysis (TGA), Thermomechanical Analysis (TMA) and X-Ray Diffractometer (XRD)